Device Testing

SPEKTRA has the following Device Testing for sensor system level testing for development and production:

S Test Lab: system level test solution for sensor lab and development environments.
S Test Fab: tailored for parallel testing of a large number of devices and allow an easy scalability while maintaining an optimized test per device cost ratio.
S-Test Interface Cards: Available measurement cards allow easy parallelization and enable high data throughput.
Exciter Systems for: Acceleration, Piezoelectrical, Shock, Acoustics, Pressure, Magnetic and Rotation
Power Amplifier: Selection of power amplifiers that offer protective functions suited to the respective exciter. They can operated in voltage or current mode.
Software with flexible software components for multiple applications

Featured Products

S-Test Lab

The S-TEST Lab systems provide a wide variety of sensor system tests for development and laboratory environments. The system components, which can be configured in a flexible manner, also allow users to react quickly to various test requirements and sensor types. From parametric tests, functional tests, measured value comparison to characterization – SPEKTRA system solutions give sensor developers extensive options for identifying design errors at an early stage.

S-TEST-Tischgerät_Details_ENG

S-TEST/2 – Compact test system for digital sensors

Can hold 2 Universal Tester Board (UTB) cards to connect up to 8 sensors (4 sensors per card)
Ethernet Interface card (ETH) for system communication, test and firmware loading and self-calibration
Integrated power supply
Foldable front stand feet
LED system status indicators
Integrated fan
Parallel sampling with timestamp

S-TEST/16 Lab – Efficient measurement system for digital sensors

Can hold up to 16 Universal Tester Board (UTB) cards to connect up to 64 sensors (4 sensors per card)
Ethernet Interface card (ETH) for system communication, test and firmware loading and self-calibration
Integrated power supply
Foldable front stand feet
LED system status indicators
Integrated fan
Parallel sampling with timestamp

S-Test Fab

The S-TEST 16 Fab systems are designed for use in sensor mass production. Their optimized design allows operation in temperature-controlled switch cabinets. Variable throughput rates and test coverages can be realized ranging from small test series to highly parallel testing of several hundred sensors.

S-TEST-16 Fab-Unit_Details_ENG

S-TEST/16 Fab – Production test system for digital sensors

Can hold 16 Universal Tester Board (UTB) cards to connect up to 64 sensors (4 sensors per card)
Ethernet Interface card (ETH) for system communication, test and firmware loading and self-calibration
Integrated power supply
LED system status indicators
Integrated fan
Parallel sampling with timestamp

S-Test Interface Card

S-TEST UTB (BSI) – Universal Tester Board

Universally applicable board for efficient System Level Test (SLT) of digital sensors, sensor characterization testing or final tests in sensor mass production.

Selected Data:
- Supply voltage range: −2 V to +20 V (25V Only UTB Power Source #4)
- Max. sensor supply current: up to ±50 mA/source
- 12.5 ns timing resolution
- Slew Rate Control (1 V/μs to 8.3 V/ms)
Features:
- Fast FPGA for FW and host interface IP cores
- Support for SPI, I²C, JTAG, SENT, PSI5, CAN‑FD2), LIN, ZACwire™
- 16 freely programmable IO pins
- 4 independent power sources
- External trigger functionality
- Fast LVDS backplane interface
- Special Function interface for custom hardware extension

S-TEST – Chassis Controller Board

Interface board for S-TEST system solutions

Digital Front-End:
- 2 x Trigger Input
- 2 x Digital Output
- 5 V Supply Voltage
- Calibration Lines for Voltage and Resistance
Communication:
- TCP control & command
- 3 x USB for Configuration and Maintenance
- DDS-module for clock generation e.g. for SPI
- 36 LVDS Lines for internal UTB communication
S-TEST Logic & FW Updates
- Easy exchange of interface logic blocks
S-TEST Chassis Self Calibration
- Highly stable reference voltage source
- Precision reference resistors

Acceleration Exciters

SE-16

Rugged vibration exciter that has been specially developed for high frequency excitation of small components and sensors both in the longitudinal and transverse direction.

Frequency Range: 5 kHz – 100 kHz (Up to 200kHz under certain conditions)
Max. Acceleration: 400 m/s²
Max. Force: 12 N

SE-14

Spring-guided vibration exciter that is suitable for daily use in the calibration laboratory as well as for vibration tests.

Frequency Range: 0 Hz – 8 kHz
Max. Acceleration: 500 m/s²
Max. Displacement (peak-peak): 20 mm
Max. Force: 265 N

SE-11

The SE-11 high frequency vibration exciter was developed especially for the characterization of sensors, MEMS and small components (up to 50 kHz).

Frequency Range: 1 kHz – 50 kHz
Max. Force: 100 N
Max. Displacement (peak-peak): 30 μm
Resonance Frequency: 52 kHz

SE-09

The air-bearing SE-09 high-frequency calibration exciter is a high-tech product developed especially for the high demands of calibration laboratories and metrology institutes as well as for characterization of MEMS sensors.

Frequency range: DC – 50 kHz (internal reference standard 5 Hz – 50 kHz)
Resonance Frequency: 52 kHz
Max. Force: 100 N
Max. Displacement (peak-peak): 8 mm

SE-13

Air-bearing electrodynamic Vibration Exciter with mounting table for high payloads up to 50 kg. Especially developed for the calibration and testing of big and heavy low frequency seismic sensors as well as geophones.

Frequency Range: 0 – 400 Hz
Max. Acceleration: 60 m/s² peak
Max. Force: 500 N
Max. Displacement (peak-peak): 25 mm

APS 113-AB

Air-bearing ELECTRO-SEIS^® Long Stroke vibration exciter – especially developed for the calibration and testing for low frequency sensors and sensor characterization.

Frequency Range: 0 – 200 Hz
Max. Force: 133 N (optional: 186 N)
Max. Displacement (peak-peak): 158 mm

APS 129

Air-bearing ELECTRO-SEIS^® Long Stroke Vibration Exciter with mounting table for high payloads up to 23 kg. Especially developed for the calibration and testing of big and heavy low frequency sensors as well as for sensor characterization.

Frequency Range: 0 – 200 Hz
Max. Force: 133 N (optional: 186 N)
Max. Displacement (peak-peak): 158 mm

APS 500

Air-bearing ELECTRO-SEIS^® Long Stroke vibration exciter with mounting table for payloads up to 3 kg. Especially developed for the calibration and testing of compact low frequency sensors and for sensor characterization at higher acceleration.

Frequency Range: DC – 200 Hz
Max. Force: 95 N
Max. Displacement (peak-peak): 152 mm

APS 600

Air-bearing ELECTRO-SEIS^®Long Stroke vibration exciter with mounting table for very high payloads. Especially developed for the calibration and testing of geophones and heavy seismic sensors.

Frequency Range: DC – 50 Hz
Max. Force: 200 N
Max. Displacement (peak-peak): 450 mm

APS 113

Ball-bearing ELECTRO-SEIS^® Long-Stroke vibration exciter for modal analysis of oscillatory structures.

Frequency Range: DC – 200 Hz
Max. Force: 133 N (optional: 186 N)
Max. Displacement (peak-peak): 158 mm

APS 400

ELECTRO-SEIS^® Long-Stroke vibration exciter with 450 N max. force that is suitable for excitation of large structures such as ceilings or bridges.

Frequency Range: DC – 200 Hz
Max. Force: 445 N
Velocity (Sine Peak): 1000 mm/s
Max. Displacement (peak-peak): 158 mm

APS 420

The strongest ELECTRO-SEIS^® Long-Stroke vibration exciter to date is used for vibration tests of airplanes and other large structures. With a maximum force of 900 N and up to 150 mm stroke the shaker unlocks a new performance level.

Frequency Range: DC – 200 Hz
Max. Force: 900 N
Velocity (Sine Peak): 1000 mm/s
Max. Displacement (peak-peak): 150 mm

Piezoelectrical Exciters

PC-X

Piezo Exciter, Multi Axis

Frequency Range: 5 kHz – 40 kHz
Max Acceleration: 300 m/s²
Typical Cross Movement: < 20 %
Operating Temperature Range: -50 °C to 140 °C
High Frequency excitation of bigger DUT (e.g. sensor cluster with gyroscopes)
Cube from technical ceramics with piezoelectric drive
Low weight and high stiffness lead to high resonance frequency
Vibration vs. temperature test in thermal chamber possible

SPEKTRA-PC-01

PC-01

Piezo Exciter, Single Axis

Frequency Range: 5 kHz – 40 kHz
Max Acceleration: 300 m/s²
Typical Cross Movement: < 20 %
Operating Temperature Range: -50 °C to 140 °C
High Frequency excitation of bigger DUT (e.g. sensor cluster with gyroscopes)
Cube from technical ceramics with piezoelectric drive
Low weight and high stiffness lead to high resonance frequency
Vibration vs. temperature test in thermal chamber possible

Shock Exciters

SPEKTRA_SE-201_PN-LMS

SE-201

Calibration of shock transducers as well as complete measuring instruments (measuring chain) with very high precision and efficiency.

Pneumatically driven shock exciter
Min. Shock Amplitude: 5 g_n
Max. Shock Amplitude: 10,000 g_n
To be used in calibration or test applications with larger pulse duration up to 5 ms.
NEW: dynamic shock pressure calibration possible

SE-220 HOP-MS

Shock exciter for testing and calibrating acceleration sensors as well as for environmental testing of small assemblies and parts.

Patent-protected Medium-shock exciter
For the amplitude range from 20 g_n up to 4,000 g_n.
This exciter provides the force impact using a piezo-actuator
Adjustable signal shape, amplitude, pulse width
This allows new possibilities to control the mechanical shock signal and with its new applications in the field of the calibration and in particular in the field of measurement and test systems (e.g. to test the shock sensibility of MEMS sensors).

SPEKTRA-SE-221-HOP-VHS

SE-221 HOP-(V)HS

Secondary calibration of shock transducers as well as complete measuring instruments in form of a measuring chain, with very high precision and efficiency.

High-shock exciter for the amplitude range up to 100,000 g_n (optionally up to 200,000 g_n) to be used in calibration or test applications.

Acoustics Exciters

SQ-4.2 (Electro-Acoustic Coupler)

True pressure chamber calibration with an acoustic coupler

Frequency Range: 31.5 Hz – 16 kHz*
Sound Pressure Level: 64 dB – 124 dB (Frequency-dependent)
True pressure chamber calibration for 1/2 and 1/4* inch microphones
- Acoustic coupler available for 1 inch microphones

* max. frequency of 2 kHz for 1/4 inch microphones

SQ-03 (Pressure Generator)

Very low frequency calibration of pressure transducers and pressure measuring devices

True pressure chamber calibration with an acoustic calibrator
Calibration of pressure transducers
Calibration of all established measuring microphones (capacitor and electrets microphones, …)

SQ-01 (Anechoic Chamber)

Compact anechoic chamber can be installed in any room without construction work

Frequency Range: 125 Hz – 20 kHz
Sound Pressure Level: 64 dB – 124 dB
calibration of microphones according to DIN EN 61094-8
calibration of sound level meters according to DIN EN 61672
periodic tests of sound level meters according to DIN EN 61672-3 (incl. electrical tests)
calibration of calibrators according to DIN EN 60942

Electro-Acoustic Coupler, SQ-4.1

True pressure chamber calibration with an acoustic coupler

Frequency Range: 31.5 Hz – 8 kHz
Sound Pressure Level: 64 dB – 94 dB
True pressure chamber calibration for 1 inch microphones

Pressure Exciters

DPE-01

Dynamic pressure exciter for secondary calibration of pressure sensors

Pressure Range: 16 kPa (0.16 bar)
Frequency Range: DC – 1.25 kHz
Pressure Amplitude: 100 Pa – 16kPa
Medium: Oil

Magnetic Exciter

FDG-15 (Flux Density Generator)

Reliable tool for generating a static flux density of up to 3 mT in any direction inside the coil system.

3-axial magnetic excitation of devices under test
Magnetic flux generator for any spatial direction
Accuracy of magnetic field vector with respect to sensor axis at least ± 1°
Earth magnetic field cancellation ≤ 1 μT
Homogeneity of flux ≤ 1 %

Dynamic Rotation Exciter

SPEKTRA-DRE-01

DRE-01

Used for calibration of transducers as well as for the characterization of devices (e.g. MEMS sensors).

Frequency Range: 1 Hz – 5 kHz
Max Payload: 0.5 kg
Very low cross-acceleration
Max Angular Velocity: 5300 °/s
Max Angular Acceleration:2 500 000 °/s²
Distortion factor (angular velocity): < 3%
Electro-dynamic drive

Options & Accessories (Temperature)

Peltier Element

Very accurate temperature control due to thermoelectric peltier effect

Temperature Range: -10°C to 70°C
Velocity of temperature change: slow (4k/min)

Climate Chamber

Wide temperature range and test of multiple samples

Temperature Range: -70°C to 180°C
Velocity of temperature change: Medium (10k/min)

Power Amplifier

PA14-180

Developed to drive any type of exciter requiring a 180 VA power amplifier

180 watt power amplifier
For calibration and testing systems
Such as the SPEKTRA calibration system CS18 MF
Fitted to suit the SE-10

S-TEST Software

A strong hardware needs an efficient software

The S-TEST software gives product and test developers a flexible software framework at hand that enable fast development as well as adaptation of sensor system level tests. Exchangable core components allow quick modification of tests to support changing sensor interfaces.

The seamless integration with the S-TEST hardware offers a powerful combination to react on varying test requirements without the need to add new and expensive test hardware.

Aligned with a feature-rich test editor the framework offers versatile API‘s to enhance and control test execution and to interface with additional systems like measurement and data storage systems. User-firendly and adaptable application front-ends allow the replication of special test scenarios and support the optimized usability for test operators.

Flexible Software components

Scalable technology, from a very simple control unit up to a very high performance and multi-channel controller
Operation modes: sine, random, shock, chart, FDR, …
Coordinated synchronized multi-channel excitation, also synchronized 3-dimensional excitation possible
Time optimized and customer specific End-Of-Line-Test

Multiple Applications

Research & Development
Vibration testing
Modal excitation
Quality assurance
Environmental testing
Investigation of microstructures
Sensor testing